High performance germanium on silicon photodiodes for back-end-of-line photonic integration

Integration of near-infrared photodetectors in the back-end-of-line requires low temperature growth of Ge (<450 °C). We have fabricated high performance, vertical incidence Ge-on-Si photodiodes under thermal budget constraints with as-grown diodes achieving an internal quantum efficiency (IQE) of...

全面介绍

书目详细资料
Main Authors: Marzen, S, Postelnicu, E, Michel, J, Wada, K, Kimerling, LC
其他作者: Massachusetts Institute of Technology. Department of Materials Science and Engineering
格式: 文件
语言:English
出版: AIP Publishing 2024
在线阅读:https://hdl.handle.net/1721.1/156903