Open volume defect accumulation with irradiation in GaN, GaP, InAs, InP, Si, ZnO, and MgO
Vacancies are generated in semiconductor devices while operating in the space radiation environment, impacting semiconductor carrier concentrations and dynamics. Positron annihilation lifetime spectroscopy (PALS) is used to probe these defect concentrations in bulk grown GaN, GaP, InAs, InP, Si, MgO...
Main Authors: | , , , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
AIP Publishing
2024
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Online Access: | https://hdl.handle.net/1721.1/156906 |