Design and Analysis of a Transformer-Based Solid-State Relay
Automatic Test Equipment (ATE) systems require relays to perform complex high-speed tests on semiconductor devices. However, existing relays all come up short in some aspect. Electromechanical reed relays have a limited lifetime and slow switching speeds, while solid-state photoMOS relays have high...
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| Format: | Thesis |
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Massachusetts Institute of Technology
2024
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| Online Access: | https://hdl.handle.net/1721.1/157012 |