A metrological atomic force microscope

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2002.

Bibliographic Details
Main Author: Stein, Andrew John, 1978-
Other Authors: David L. Trumper.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/16885