Dynamic scan chains : a novel architecture to lower the cost of VLSI test

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.

Bibliographic Details
Main Author:	Sitchinava, Nodari S. (Nodari Shalva), 1981-
Other Authors:	Rohit Kapur and Daniel A. Spielman.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2005
Subjects:	Electrical Engineering and Computer Science.
Online Access:	http://hdl.handle.net/1721.1/18034

Internet

http://hdl.handle.net/1721.1/18034