Sequential screening in semiconductor manufacturing.
Includes bibliographical references (p. 41-42).
| Other Authors: | |
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| Language: | eng |
| Published: |
Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992.
2003
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/2427 |
| _version_ | 1826215208254701568 |
|---|---|
| author2 | Longtin, Mark D. |
| author_facet | Longtin, Mark D. |
| collection | MIT |
| description | Includes bibliographical references (p. 41-42). |
| first_indexed | 2024-09-23T16:19:29Z |
| id | mit-1721.1/2427 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T16:19:29Z |
| publishDate | 2003 |
| publisher | Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992. |
| record_format | dspace |
| spelling | mit-1721.1/24272019-04-11T09:49:43Z Sequential screening in semiconductor manufacturing. Longtin, Mark D. Wein, Lawrence M. Welsch, Roy E. HD28 .M414 no.3452-, 92 Includes bibliographical references (p. 41-42). Supported by a grant from the Leaders for Manufacturing Program at MIT, and a grant from the National Science Foundation. DDM-9057297 Mark D. Longtin, Lawrence M. Wein and Roy E. Welsch. 2003-04-29T05:07:18Z 2003-04-29T05:07:18Z 2003-04-29T05:07:18Z # 3452-92-MSA http://hdl.handle.net/1721.1/2427 eng Working paper (Sloan School of Management) ; 3452-92. 45 p. 3295116 bytes application/pdf application/pdf Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992. |
| spellingShingle | HD28 .M414 no.3452-, 92 Sequential screening in semiconductor manufacturing. |
| title | Sequential screening in semiconductor manufacturing. |
| title_full | Sequential screening in semiconductor manufacturing. |
| title_fullStr | Sequential screening in semiconductor manufacturing. |
| title_full_unstemmed | Sequential screening in semiconductor manufacturing. |
| title_short | Sequential screening in semiconductor manufacturing. |
| title_sort | sequential screening in semiconductor manufacturing |
| topic | HD28 .M414 no.3452-, 92 |
| url | http://hdl.handle.net/1721.1/2427 |