Fine-grained fault-tolerance : reliability as a fungible resource

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.

Bibliographic Details
Main Author:	Impens, François, 1977-
Other Authors:	Isaac L. Chuang.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2006
Subjects:	Electrical Engineering and Computer Science.
Online Access:	http://hdl.handle.net/1721.1/30103

Internet

http://hdl.handle.net/1721.1/30103