New methodologies for interconnect reliability assessments of integrated circuits

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2000.

Bibliographic Details
Main Author:	Hau-Riege, Stefan P. (Stefan Peter), 1970-
Other Authors:	Carl V. Thompson.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2006
Subjects:	Materials Science and Engineering.
Online Access:	http://hdl.handle.net/1721.1/31092

Internet

http://hdl.handle.net/1721.1/31092