An analysis of SIFT object recognition with an emphasis on landmark detection

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.

Bibliographic Details
Main Author:	Ross, Benjamin Charles
Other Authors:	Trevor J. Darrell.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2006
Subjects:	Electrical Engineering and Computer Science.
Online Access:	http://hdl.handle.net/1721.1/33341

Internet

http://hdl.handle.net/1721.1/33341