Analysis of variability in the semiconductor industry

Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Chemical Engineering; in conjunction with the Leaders for Manufacturing Program at MIT, 2004.

Bibliographic Details
Main Author: Levesque, Joseph C. (Joseph Christopher), 1973-
Other Authors: Donald B. Rosenfield and David Simchi-Levi.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2006
Subjects:
Online Access:http://hdl.handle.net/1721.1/34764