12.141 Electron Microprobe Analysis, January (IAP) 2003

12.141 Electron Microprobe Analysis, January (IAP) 2003

Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions...

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Bibliographic Details
Main Authors: Chatterjee, Nilanjan, Grove, Timothy L.
Other Authors: Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences
Format: Learning Object
Language:en-US
Published: 2003
Subjects:
x-ray microanalysis
electron microprobe
ZAF matrix corrections
wavelength and energy dispersive spectrometry
scanning backscattered electron
secondary electron
cathodoluminescence
X-ray imaging
Microprobe analysis
Online Access:http://hdl.handle.net/1721.1/35789

Internet

http://hdl.handle.net/1721.1/35789

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