12.141 Electron Microprobe Analysis, January (IAP) 2003
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Learning Object |
| Language: | en-US |
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2003
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| Online Access: | http://hdl.handle.net/1721.1/35789 |
| _version_ | 1826196541923131392 |
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| author | Chatterjee, Nilanjan Grove, Timothy L. |
| author2 | Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences |
| author_facet | Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences Chatterjee, Nilanjan Grove, Timothy L. |
| author_sort | Chatterjee, Nilanjan |
| collection | MIT |
| description | Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe. |
| first_indexed | 2024-09-23T10:29:00Z |
| format | Learning Object |
| id | mit-1721.1/35789 |
| institution | Massachusetts Institute of Technology |
| language | en-US |
| last_indexed | 2025-03-10T08:52:18Z |
| publishDate | 2003 |
| record_format | dspace |
| spelling | mit-1721.1/357892025-02-26T17:18:10Z 12.141 Electron Microprobe Analysis, January (IAP) 2003 Electron Microprobe Analysis Chatterjee, Nilanjan Grove, Timothy L. Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences x-ray microanalysis electron microprobe ZAF matrix corrections wavelength and energy dispersive spectrometry scanning backscattered electron secondary electron cathodoluminescence X-ray imaging Microprobe analysis Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe. 2003-01 Learning Object 12.141-January(IAP)2003 local: 12.141 local: IMSCP-MD5-93cae862f67ea8a9184486512eb71a72 http://hdl.handle.net/1721.1/35789 en-US Usage Restrictions: This site (c) Massachusetts Institute of Technology 2003. Content within individual courses is (c) by the individual authors unless otherwise noted. The Massachusetts Institute of Technology is providing this Work (as defined below) under the terms of this Creative Commons public license ("CCPL" or "license"). The Work is protected by copyright and/or other applicable law. Any use of the work other than as authorized under this license is prohibited. By exercising any of the rights to the Work provided here, You (as defined below) accept and agree to be bound by the terms of this license. The Licensor, the Massachusetts Institute of Technology, grants You the rights contained here in consideration of Your acceptance of such terms and conditions. 15034 bytes 14201 bytes 22661 bytes 12148 bytes 12659 bytes 11468 bytes 11 bytes 4586 bytes 21366 bytes 11602 bytes 38351 bytes 4755 bytes 27322 bytes 25313 bytes 4039 bytes 301 bytes 354 bytes 339 bytes 180 bytes 285 bytes 67 bytes 17685 bytes 49 bytes 143 bytes 247 bytes 19283 bytes 262 bytes 14317 bytes 1518558 bytes 27806 bytes 102795 bytes 22629 bytes 22405 bytes 14803 bytes 1084368 bytes 1517225 bytes 920402 bytes 81569 bytes 19283 bytes 3486 bytes 811 bytes 813 bytes 830 bytes 595 bytes 2097 bytes 26514 bytes 8112 bytes 8112 bytes 8912 bytes 7471 bytes 8144 bytes 7431 bytes 8113 bytes 7477 bytes 8864 bytes 7426 bytes 8086 bytes 8143 bytes 8135 bytes 8112 bytes 8112 bytes 7461 bytes 7507 bytes text/html January (IAP) 2003 |
| spellingShingle | x-ray microanalysis electron microprobe ZAF matrix corrections wavelength and energy dispersive spectrometry scanning backscattered electron secondary electron cathodoluminescence X-ray imaging Microprobe analysis Chatterjee, Nilanjan Grove, Timothy L. 12.141 Electron Microprobe Analysis, January (IAP) 2003 |
| title | 12.141 Electron Microprobe Analysis, January (IAP) 2003 |
| title_full | 12.141 Electron Microprobe Analysis, January (IAP) 2003 |
| title_fullStr | 12.141 Electron Microprobe Analysis, January (IAP) 2003 |
| title_full_unstemmed | 12.141 Electron Microprobe Analysis, January (IAP) 2003 |
| title_short | 12.141 Electron Microprobe Analysis, January (IAP) 2003 |
| title_sort | 12 141 electron microprobe analysis january iap 2003 |
| topic | x-ray microanalysis electron microprobe ZAF matrix corrections wavelength and energy dispersive spectrometry scanning backscattered electron secondary electron cathodoluminescence X-ray imaging Microprobe analysis |
| url | http://hdl.handle.net/1721.1/35789 |
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