Simulating scanning tunneling microscope measurements

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006.

Detalhes bibliográficos
Autor principal:	Venkatachalam, Vivek
Outros Autores:	Eric W. Hudson.
Formato:	Tese
Idioma:	eng
Publicado em:	Massachusetts Institute of Technology 2007
Assuntos:	Physics.
Acesso em linha:	http://hdl.handle.net/1721.1/36116

Internet

http://hdl.handle.net/1721.1/36116