Mapping bulk electrical properties with non-contact RF measurements

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006.

Bibliographic Details
Main Author:	Schwartz, Benjamin M. (Benjamin Matthew)
Other Authors:	Daniel Sodickson.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2007
Subjects:	Physics.
Online Access:	http://hdl.handle.net/1721.1/36118

Internet

http://hdl.handle.net/1721.1/36118