Mapping bulk electrical properties with non-contact RF measurements

Mapping bulk electrical properties with non-contact RF measurements

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006.

Bibliographic Details
Main Author: Schwartz, Benjamin M. (Benjamin Matthew)
Other Authors: Daniel Sodickson.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2007
Subjects:
Physics.
Online Access:http://hdl.handle.net/1721.1/36118

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