Improving reuse of semiconductor equipment through benchmarking, standardization, and automation

Improving reuse of semiconductor equipment through benchmarking, standardization, and automation

Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering; in conjunction with the Leaders for Manufacturing Program at MIT, 2006.

Bibliographic Details
Main Author: Silber, Jacob B. (Jacob Bradley)
Other Authors: Donald Rosenfield and David H. Marks.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2007
Subjects:
Sloan School of Management.
Civil and Environmental Engineering.
Leaders for Manufacturing Program.
Online Access:http://hdl.handle.net/1721.1/37235

Internet

http://hdl.handle.net/1721.1/37235

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