Review of Direct Metal Bonding for Microelectronic Interconnections

Microelectronic interconnections require advanced joining techniques. Direct metal bonding methods, which include thercomsonic and thermocompression bonding, offer remarkable advantages over soldering and adhesives joining. These processes are reviewed in this paper. The progress made in this area i...

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Main Authors: Zhang, G.G., Wong, Chee Cheong
Format: Article
Language:en_US
Published: 2003
Subjects:
Online Access:http://hdl.handle.net/1721.1/3840
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author Zhang, G.G.
Wong, Chee Cheong
author_facet Zhang, G.G.
Wong, Chee Cheong
author_sort Zhang, G.G.
collection MIT
description Microelectronic interconnections require advanced joining techniques. Direct metal bonding methods, which include thercomsonic and thermocompression bonding, offer remarkable advantages over soldering and adhesives joining. These processes are reviewed in this paper. The progress made in this area is outlined. Some work concerned with the bonding modeling is also presented. This model is based on the joint interface mechanics resulting from compression. Both bump and substrate deformation are taken into account. The improved understanding of the relationship between the deformation and bonding formation may provide more accurate joint evaluation criterion.
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spelling mit-1721.1/38402019-04-12T07:40:26Z Review of Direct Metal Bonding for Microelectronic Interconnections Zhang, G.G. Wong, Chee Cheong direct metal bonding microelectronic interconnections bump deformation substrate deformation thermosonic bonding compression modeling thermocompression bonding Microelectronic interconnections require advanced joining techniques. Direct metal bonding methods, which include thercomsonic and thermocompression bonding, offer remarkable advantages over soldering and adhesives joining. These processes are reviewed in this paper. The progress made in this area is outlined. Some work concerned with the bonding modeling is also presented. This model is based on the joint interface mechanics resulting from compression. Both bump and substrate deformation are taken into account. The improved understanding of the relationship between the deformation and bonding formation may provide more accurate joint evaluation criterion. Singapore-MIT Alliance (SMA) 2003-12-13T17:46:30Z 2003-12-13T17:46:30Z 2004-01 Article http://hdl.handle.net/1721.1/3840 en_US Advanced Materials for Micro- and Nano-Systems (AMMNS); 343178 bytes application/pdf application/pdf
spellingShingle direct metal bonding
microelectronic interconnections
bump deformation
substrate deformation
thermosonic bonding
compression modeling
thermocompression bonding
Zhang, G.G.
Wong, Chee Cheong
Review of Direct Metal Bonding for Microelectronic Interconnections
title Review of Direct Metal Bonding for Microelectronic Interconnections
title_full Review of Direct Metal Bonding for Microelectronic Interconnections
title_fullStr Review of Direct Metal Bonding for Microelectronic Interconnections
title_full_unstemmed Review of Direct Metal Bonding for Microelectronic Interconnections
title_short Review of Direct Metal Bonding for Microelectronic Interconnections
title_sort review of direct metal bonding for microelectronic interconnections
topic direct metal bonding
microelectronic interconnections
bump deformation
substrate deformation
thermosonic bonding
compression modeling
thermocompression bonding
url http://hdl.handle.net/1721.1/3840
work_keys_str_mv AT zhanggg reviewofdirectmetalbondingformicroelectronicinterconnections
AT wongcheecheong reviewofdirectmetalbondingformicroelectronicinterconnections