Mechanical Characterization of the Heat Affected Zone of Gold Wirebonds Using Nanoindentation
With increasing miniaturization in microelectronics the wirebonds used in IC packages are witnessing a thrust towards fine pitch wirebonding. To have a precise control over loop height of the wirebond for fine pitch wirebonding, it is imperative to do mechanical characterization of the wirebond. The...
Main Authors: | Shah, M., Zeng, K., Tay, A.A.O., Suresh, Subra |
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Format: | Article |
Language: | en_US |
Published: |
2003
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Subjects: | |
Online Access: | http://hdl.handle.net/1721.1/3979 |
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