Testing of a first-generation dynamically programmable gate array

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.

Bibliographic Details
Main Author:	Tau, Edward F. (Edward Feiward)
Other Authors:	Thomas F. Knight, Jr.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2008
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/40201

Internet

http://hdl.handle.net/1721.1/40201