Testing of a first-generation dynamically programmable gate array
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
| Published: |
Massachusetts Institute of Technology
2008
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/40201 |
| _version_ | 1826212778943184896 |
|---|---|
| author | Tau, Edward F. (Edward Feiward) |
| author2 | Thomas F. Knight, Jr. |
| author_facet | Thomas F. Knight, Jr. Tau, Edward F. (Edward Feiward) |
| author_sort | Tau, Edward F. (Edward Feiward) |
| collection | MIT |
| description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. |
| first_indexed | 2024-09-23T15:37:47Z |
| format | Thesis |
| id | mit-1721.1/40201 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T15:37:47Z |
| publishDate | 2008 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/402012019-04-11T14:23:15Z Testing of a first-generation dynamically programmable gate array Tau, Edward F. (Edward Feiward) Thomas F. Knight, Jr. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. Includes bibliographical references (p. 57-58). by Edward F. Tau. M.Eng. 2008-02-04T20:59:47Z 2008-02-04T20:59:47Z 1996 1996 Thesis http://hdl.handle.net/1721.1/40201 35561969 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 58 p. application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science Tau, Edward F. (Edward Feiward) Testing of a first-generation dynamically programmable gate array |
| title | Testing of a first-generation dynamically programmable gate array |
| title_full | Testing of a first-generation dynamically programmable gate array |
| title_fullStr | Testing of a first-generation dynamically programmable gate array |
| title_full_unstemmed | Testing of a first-generation dynamically programmable gate array |
| title_short | Testing of a first-generation dynamically programmable gate array |
| title_sort | testing of a first generation dynamically programmable gate array |
| topic | Electrical Engineering and Computer Science |
| url | http://hdl.handle.net/1721.1/40201 |
| work_keys_str_mv | AT tauedwardfedwardfeiward testingofafirstgenerationdynamicallyprogrammablegatearray |