Vertical profile engineering and reliability study of silicon-germanium heterojunction bipolar transistors

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.

Bibliographic Details
Main Author:	Liao, Kenneth S. (Kenneth Sen-Chun)
Other Authors:	L. Rafael Reif.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2008
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/41347

Internet

http://hdl.handle.net/1721.1/41347