Vertical profile engineering and reliability study of silicon-germanium heterojunction bipolar transistors

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.

Bibliografiske detaljer
Hovedforfatter: Liao, Kenneth S. (Kenneth Sen-Chun)
Andre forfattere: L. Rafael Reif.
Format: Thesis
Sprog:eng
Udgivet: Massachusetts Institute of Technology 2008
Fag:
Online adgang:http://hdl.handle.net/1721.1/41347