Characterization of hot-carrier reliability in analog sub-circuit design

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.

Bibliographic Details
Main Author:	Le, Huy X. P
Other Authors:	James E. Chung.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2008
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/41379

Internet

http://hdl.handle.net/1721.1/41379