Characterization of hot-carrier reliability in analog sub-circuit design
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
| Published: |
Massachusetts Institute of Technology
2008
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/41379 |
| _version_ | 1811079429156241408 |
|---|---|
| author | Le, Huy X. P |
| author2 | James E. Chung. |
| author_facet | James E. Chung. Le, Huy X. P |
| author_sort | Le, Huy X. P |
| collection | MIT |
| description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. |
| first_indexed | 2024-09-23T11:14:52Z |
| format | Thesis |
| id | mit-1721.1/41379 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T11:14:52Z |
| publishDate | 2008 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/413792019-04-10T18:27:58Z Characterization of hot-carrier reliability in analog sub-circuit design Le, Huy X. P James E. Chung. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. Includes bibliographical references (leaves 52-54). by Huy X.P. Le. M.Eng. 2008-04-23T14:52:31Z 2008-04-23T14:52:31Z 1996 1996 Thesis http://hdl.handle.net/1721.1/41379 35334375 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 54 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science Le, Huy X. P Characterization of hot-carrier reliability in analog sub-circuit design |
| title | Characterization of hot-carrier reliability in analog sub-circuit design |
| title_full | Characterization of hot-carrier reliability in analog sub-circuit design |
| title_fullStr | Characterization of hot-carrier reliability in analog sub-circuit design |
| title_full_unstemmed | Characterization of hot-carrier reliability in analog sub-circuit design |
| title_short | Characterization of hot-carrier reliability in analog sub-circuit design |
| title_sort | characterization of hot carrier reliability in analog sub circuit design |
| topic | Electrical Engineering and Computer Science |
| url | http://hdl.handle.net/1721.1/41379 |
| work_keys_str_mv | AT lehuyxp characterizationofhotcarrierreliabilityinanalogsubcircuitdesign |