Test Programming by Program Composition and Symbolic Simulation
Classical test generation techniques rely on search through gate-level circuit descriptions, which results in long runtimes. In some instances, classical techniques cannot be used because they would take longer than the lifetime of the product to generate tests which are needed when the first device...
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| Format: | Working Paper |
| Language: | en_US |
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MIT Artificial Intelligence Laboratory
2008
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| Online Access: | http://hdl.handle.net/1721.1/41489 |