Elusive Quest for Interoperability

A pessimist sees the difficulty in every opportunity. An optimist sees the opportunity in every difficulty.

Bibliographic Details
Main Author: Datta, Shoumen
Other Authors: Massachusetts Institute of Technology. Auto-ID Laboratory
Format: Article
Language:English
Published: World Customs Organization (WCO-OMD), Brussels, Belgium 2008
Subjects:
Online Access:http://hdl.handle.net/1721.1/41916