Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.

Bibliographic Details
Main Author:	Dao, Steve Gia, 1973-
Other Authors:	James Chung.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2009
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/47435

Internet

http://hdl.handle.net/1721.1/47435