An x-ray method for measuring the thickness of thin crystalline films

"Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946."

Bibliographic Details
Other Authors:	Eisenstein, A. S.
Language:	eng
Published:	Research Laboratory of Electronics, Massachusetts Institute of Technology 2004
Subjects:	TK7855.M41 R43 no.17 Thin films
Online Access:	http://hdl.handle.net/1721.1/5029

Internet

http://hdl.handle.net/1721.1/5029