An x-ray method for measuring the thickness of thin crystalline films
"Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946."
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| Language: | eng |
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Research Laboratory of Electronics, Massachusetts Institute of Technology
2004
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| Online Access: | http://hdl.handle.net/1721.1/5029 |
| Summary: | "Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946." |
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