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Transistor and Diode Studies

Transistor and Diode Studies

Show other versions (2)

Contains reports on four research projects.

Bibliographic Details
Main Authors: Lipsky, A. H., Hurtig, C. R., Martindale, R. B., Jackson, W. D., Nelson, R. E.
Format: Technical Report
Language:English
Published: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:
Transistor and Diode Studies
Temperature Coefficient of Silicon Junction Transition Capacity
Temperature Dependence of Forward-Biased Junction Diodes
Crystal Admittance Measurements
Point-Contact Diode Static Characteristics
Online Access:http://hdl.handle.net/1721.1/52058
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Internet

http://hdl.handle.net/1721.1/52058

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