An Analytical Technique to Elucidate Field Impurities From Manufacturing Uncertainties of an Double Pancake Type HTS Insert for High Field LTS/HTS NMR Magnets

An Analytical Technique to Elucidate Field Impurities From Manufacturing Uncertainties of an Double Pancake Type HTS Insert for High Field LTS/HTS NMR Magnets

This paper addresses adverse effects of dimensional uncertainties of an HTS insert assembled with double-pancake coils on spatial field homogeneity. Each DP coil was wound with Bi2223 tapes having dimensional tolerances larger than one order of magnitude of those accepted for LTS wires used in conve...

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Bibliographic Details
Main Authors: Iwasa, Yukikazu, Bascunan, Juan, Bobrov, Emanuel Saul, Ahn, Min Cheol, Hahn, Seung-Yong
Other Authors: Francis Bitter Magnet Laboratory (Massachusetts Institute of Technology)
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers 2010
Online Access:http://hdl.handle.net/1721.1/52426
https://orcid.org/0000-0001-5712-7350

Internet

http://hdl.handle.net/1721.1/52426
https://orcid.org/0000-0001-5712-7350

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