A 65 nm Sub- V_{t} Microcontroller With Integrated SRAM and Switched Capacitor DC-DC Converter
Aggressive supply voltage scaling to below the device threshold voltage provides significant energy and leakage power reduction in logic and SRAM circuits. Consequently, it is a compelling strategy for energy-constrained systems with relaxed performance requirements. However, effects of process vari...
Main Authors: | , , , |
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Other Authors: | |
Format: | Article |
Language: | en_US |
Published: |
Institute of Electrical and Electronics Engineers
2010
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Online Access: | http://hdl.handle.net/1721.1/52467 https://orcid.org/0000-0002-5977-2748 |