PAG segregation during exposure affecting innate material roughness
We have developed an improved AFM-based technique to measure intrinsic material roughness (IMR) after base development. We have investigated the contribution of different polymeric PAGs to IMR. These polymeric PAGs include copolymers of several styrenic PAGs with hydroxystyrene. The IMR of these pol...
Main Authors: | Pottebaum, Indira, Cann, Susan G., Cabral, Alberto, Astolfi, David K., Fedynyshyn, Theodore H., Roberts, Jeanette M. |
---|---|
Other Authors: | Lincoln Laboratory |
Format: | Article |
Language: | en_US |
Published: |
The International Society for Optical Engineering
2010
|
Online Access: | http://hdl.handle.net/1721.1/52663 |
Similar Items
-
Sensitivity of EUV resists to out-of-band radiation
by: Roberts, Jeanette M., et al.
Published: (2010) -
Resist roughness Bi-modality as revealed by two-dimensional FFT 2D analysis
by: Cann, Susan G., et al.
Published: (2010) -
Polymer photochemistry at the EUV wavelength
by: Fedynyshyn, Theodore H., et al.
Published: (2011) -
Electron-beam Directed Materials Assembly
by: Fedynyshyn, Theodore H., et al.
Published: (2010) -
Sonication Time Effect towards Stability of Al2O3/PAG and SiO2/PAG Nanolubricants
by: A. A. M., Redhwan, et al.
Published: (2018)