High index 193 nm immersion lithography: The beginning or the end of the road
For several years, SEMATECH has invested significant effort into extending 193 nm immersion lithography by developing a set of high index materials. For high index immersion lithography (HIL) to enable 1.70NA imaging, a high index lens element with an absorbance < 0.005/cm, a fluid with an index...
Main Authors: | Zimmerman, Paul A., Rice, Bryan J., Piscani, Emil C., Liberman, Vladimir |
---|---|
Other Authors: | Lincoln Laboratory |
Format: | Article |
Language: | en_US |
Published: |
Society of Photo-optical Instrumentation Engineers
2010
|
Online Access: | http://hdl.handle.net/1721.1/52703 |
Similar Items
-
TMS--the beginning of the end or the end of the beginning?
by: Ebmeier, K, et al.
Published: (2008) -
Molecular photofragment orientation in the photodissociation of H2O2 at 193 nm and 248 nm.
by: Chang, Y, et al.
Published: (2011) -
Development of an immersion maskless lithography system
by: Chao, David, Ph. D. Massachusetts Institute of Technology
Published: (2006) -
PRODUCT YIELDS AND MECHANISM OF THE EXCIMER LASER PHOTOLYSIS OF AZOMETHANE AT 193 NM
by: Baggott, J, et al.
Published: (1987) -
Photofragmentation dynamics of N,N-dimethylformamide following excitation at 193 nm
by: Lipciuc, M, et al.
Published: (2017)