Synchrotron radiation x-ray absorption fine-structure and Raman studies on CdZnTe ternary alloys
The synchrotron radiation (SR) X-ray absorption fine-structure spectroscopy (XAFS) technology has been employed to obtained Zn K-edge absorption spectra for Cd1[subscript 1-x]Zn[subscript x]Te alloy with x = 0.03, 0.10, 0.20, 0.30, 0.40, 0.50 and 1.00. Their Fourier transform spectra were analyzed,...
| Main Authors: | , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
The International Society for Optical Engineering
2010
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| Online Access: | http://hdl.handle.net/1721.1/52737 https://orcid.org/0000-0002-0769-0652 |