Evaluation of the colossal electroresistance (CER) effect and its application in the non-volatile Resistive Random Access Memory (RRAM)

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2009.

Detalles Bibliográficos
Autor principal: Wicaksono, Aulia Tegar
Otros Autores: Caroline A. Ross.
Formato: Tesis
Lenguaje:eng
Publicado: Massachusetts Institute of Technology 2010
Materias:
Acceso en línea:http://hdl.handle.net/1721.1/54567