Evaluation of the colossal electroresistance (CER) effect and its application in the non-volatile Resistive Random Access Memory (RRAM)

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2009.

Detalles Bibliográficos
Autor principal:	Wicaksono, Aulia Tegar
Otros Autores:	Caroline A. Ross.
Formato:	Tesis
Lenguaje:	eng
Publicado:	Massachusetts Institute of Technology 2010
Materias:	Materials Science and Engineering.
Acceso en línea:	http://hdl.handle.net/1721.1/54567

Internet

http://hdl.handle.net/1721.1/54567