An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes

Due to technology scaling, integrated circuit manufacturing techniques are producing structures with large variabilities in their dimensions. To guarantee high yield, the manufactured structures must have the proper electrical characteristics despite such geometrical variations. For a designer, this...

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书目详细资料
Main Authors: Elfadel, Ibrahim M., El-Moselhy, Tarek Ali, Dewey, Bill
其他作者: Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
格式: 文件
语言:en_US
出版: Institute of Electrical and Electronics Engineers 2010
主题:
在线阅读:http://hdl.handle.net/1721.1/54699