An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes

Due to technology scaling, integrated circuit manufacturing techniques are producing structures with large variabilities in their dimensions. To guarantee high yield, the manufactured structures must have the proper electrical characteristics despite such geometrical variations. For a designer, this...

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Bibliographic Details
Main Authors: Elfadel, Ibrahim M., El-Moselhy, Tarek Ali, Dewey, Bill
Other Authors: Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers 2010
Subjects:
Online Access:http://hdl.handle.net/1721.1/54699