An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes
Due to technology scaling, integrated circuit manufacturing techniques are producing structures with large variabilities in their dimensions. To guarantee high yield, the manufactured structures must have the proper electrical characteristics despite such geometrical variations. For a designer, this...
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| Format: | Article |
| Language: | en_US |
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Institute of Electrical and Electronics Engineers
2010
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| Online Access: | http://hdl.handle.net/1721.1/54699 |
| _version_ | 1826200294237667328 |
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| author | Elfadel, Ibrahim M. El-Moselhy, Tarek Ali Dewey, Bill |
| author2 | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics |
| author_facet | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics Elfadel, Ibrahim M. El-Moselhy, Tarek Ali Dewey, Bill |
| author_sort | Elfadel, Ibrahim M. |
| collection | MIT |
| description | Due to technology scaling, integrated circuit manufacturing techniques are producing structures with large variabilities in their dimensions. To guarantee high yield, the manufactured structures must have the proper electrical characteristics despite such geometrical variations. For a designer, this means extracting the electrical characteristics of a whole family of structure realizations in order to guarantee that they all satisfy the required electrical characteristics. Sensitivity extraction provides an efficient algorithm to extract all realizations concurrently. This paper presents a complete framework for efficient resistance sensitivity extraction. The framework is based on both the finite element method (FEM) for resistance extraction and the adjoint method for sensitivity analysis. FEM enables the calculation of resistances of interconnects of arbitrary shapes, while the adjoint method enables sensitivity calculation in a computational complexity that is independent of the number of varying parameters. The accuracy and efficiency of the algorithm are demonstrated on a variety of complex examples. |
| first_indexed | 2024-09-23T11:34:16Z |
| format | Article |
| id | mit-1721.1/54699 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T11:34:16Z |
| publishDate | 2010 |
| publisher | Institute of Electrical and Electronics Engineers |
| record_format | dspace |
| spelling | mit-1721.1/546992022-10-01T04:29:24Z An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes Elfadel, Ibrahim M. El-Moselhy, Tarek Ali Dewey, Bill Massachusetts Institute of Technology. Department of Aeronautics and Astronautics El-Moselhy, Tarek Ali Elfadel, Ibrahim M. El-Moselhy, Tarek Ali shape variations sensitivity resistance extraction finite-element method adjoint method Due to technology scaling, integrated circuit manufacturing techniques are producing structures with large variabilities in their dimensions. To guarantee high yield, the manufactured structures must have the proper electrical characteristics despite such geometrical variations. For a designer, this means extracting the electrical characteristics of a whole family of structure realizations in order to guarantee that they all satisfy the required electrical characteristics. Sensitivity extraction provides an efficient algorithm to extract all realizations concurrently. This paper presents a complete framework for efficient resistance sensitivity extraction. The framework is based on both the finite element method (FEM) for resistance extraction and the adjoint method for sensitivity analysis. FEM enables the calculation of resistances of interconnects of arbitrary shapes, while the adjoint method enables sensitivity calculation in a computational complexity that is independent of the number of varying parameters. The accuracy and efficiency of the algorithm are demonstrated on a variety of complex examples. 2010-05-04T17:37:56Z 2010-05-04T17:37:56Z 2009-08 Article http://purl.org/eprint/type/ConferencePaper 978-1-6055-8497-3 0738-100X http://hdl.handle.net/1721.1/54699 Dewey, B., I.M. Elfadel, and T. El-Moselhy. “An efficient resistance sensitivity extraction algorithm for conductors of arbitrary shapes.” Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE. 2009. 770-775. © 2009 IEEE en_US 46th ACM/IEEE Design Automation Conference, 2009. DAC '09. Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Institute of Electrical and Electronics Engineers IEEE |
| spellingShingle | shape variations sensitivity resistance extraction finite-element method adjoint method Elfadel, Ibrahim M. El-Moselhy, Tarek Ali Dewey, Bill An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes |
| title | An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes |
| title_full | An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes |
| title_fullStr | An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes |
| title_full_unstemmed | An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes |
| title_short | An Efficient Resistance Sensitivity Extraction Algorithm for Conductors of Arbitrary Shapes |
| title_sort | efficient resistance sensitivity extraction algorithm for conductors of arbitrary shapes |
| topic | shape variations sensitivity resistance extraction finite-element method adjoint method |
| url | http://hdl.handle.net/1721.1/54699 |
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