12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January (IAP) 2006
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Learning Object |
| Language: | en-US |
| Published: |
2010
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/55816 |