12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January (IAP) 2006
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions...
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| Format: | Learning Object |
| Language: | en-US |
| Published: |
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/55816 |
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12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January IAP 2010
Published 2010
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Learning Object