Synchrotron X-Ray Studies of Surface Disordering

Contains table of contents for Section 4, an introduction and a report on one research project.

Dades bibliogràfiques
Autors principals:	Birgeneau, Robert J., Greven, Martin, Ramstad, Monte J., Michael J. Young, Michael J., Martin, Debra L.
Format:	Technical Report
Idioma:	English
Publicat:	Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Matèries:	Synchrotron X-Ray Studies of Surface Disordering Stability of Vicinal Si(111) Surfaces Under Sublimation Stability of Vicinal Si(111) Surfaces Under Electromigration
Accés en línia:	http://hdl.handle.net/1721.1/57360

Internet

http://hdl.handle.net/1721.1/57360