Synchrotron X-Ray Studies of Surface Disordering
Contains table of contents for Section 4, an introduction and a report on one research project.
| Main Authors: | , , , , |
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| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/57360 |
| _version_ | 1826193911793582080 |
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| author | Birgeneau, Robert J. Greven, Martin Ramstad, Monte J. Michael J. Young, Michael J. Martin, Debra L. |
| author_facet | Birgeneau, Robert J. Greven, Martin Ramstad, Monte J. Michael J. Young, Michael J. Martin, Debra L. |
| author_sort | Birgeneau, Robert J. |
| collection | MIT |
| description | Contains table of contents for Section 4, an introduction and a report on one research project. |
| first_indexed | 2024-09-23T09:47:14Z |
| format | Technical Report |
| id | mit-1721.1/57360 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T09:47:14Z |
| publishDate | 2010 |
| publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| record_format | dspace |
| spelling | mit-1721.1/573602019-04-10T13:33:11Z Synchrotron X-Ray Studies of Surface Disordering Birgeneau, Robert J. Greven, Martin Ramstad, Monte J. Michael J. Young, Michael J. Martin, Debra L. Synchrotron X-Ray Studies of Surface Disordering Stability of Vicinal Si(111) Surfaces Under Sublimation Stability of Vicinal Si(111) Surfaces Under Electromigration Contains table of contents for Section 4, an introduction and a report on one research project. Joint Services Electronics Program Contract DAAL03-92-C-0001 2010-07-17T01:06:27Z 2010-07-17T01:06:27Z 1996-01-01 to 1996-12-31 Technical Report RLE_PR_139_01_04s_01 http://hdl.handle.net/1721.1/57360 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1996 Solid State Physics, Electronics and Optics Surfaces and Interfaces Synchrotron X-Ray Studies of Surface Disordering Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 139 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| spellingShingle | Synchrotron X-Ray Studies of Surface Disordering Stability of Vicinal Si(111) Surfaces Under Sublimation Stability of Vicinal Si(111) Surfaces Under Electromigration Birgeneau, Robert J. Greven, Martin Ramstad, Monte J. Michael J. Young, Michael J. Martin, Debra L. Synchrotron X-Ray Studies of Surface Disordering |
| title | Synchrotron X-Ray Studies of Surface Disordering |
| title_full | Synchrotron X-Ray Studies of Surface Disordering |
| title_fullStr | Synchrotron X-Ray Studies of Surface Disordering |
| title_full_unstemmed | Synchrotron X-Ray Studies of Surface Disordering |
| title_short | Synchrotron X-Ray Studies of Surface Disordering |
| title_sort | synchrotron x ray studies of surface disordering |
| topic | Synchrotron X-Ray Studies of Surface Disordering Stability of Vicinal Si(111) Surfaces Under Sublimation Stability of Vicinal Si(111) Surfaces Under Electromigration |
| url | http://hdl.handle.net/1721.1/57360 |
| work_keys_str_mv | AT birgeneaurobertj synchrotronxraystudiesofsurfacedisordering AT grevenmartin synchrotronxraystudiesofsurfacedisordering AT ramstadmontej synchrotronxraystudiesofsurfacedisordering AT michaeljyoungmichaelj synchrotronxraystudiesofsurfacedisordering AT martindebral synchrotronxraystudiesofsurfacedisordering |