Boning, D. S., Taylor, H. K., & Science, M. I. o. T. D. o. E. E. a. C. (2010). Towards nanoimprint lithography-aware layout design checking. SPIE.
Chicago Style (17th ed.) CitationBoning, Duane S., Hayden Kingsley Taylor, and Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Towards Nanoimprint Lithography-aware Layout Design Checking. SPIE, 2010.
MLA (9th ed.) CitationBoning, Duane S., et al. Towards Nanoimprint Lithography-aware Layout Design Checking. SPIE, 2010.
Warning: These citations may not always be 100% accurate.