Blackbox polynomial identity testing for depth 3 circuits

Blackbox polynomial identity testing for depth 3 circuits

We study EIIE(k) circuits, i.e., depth three arithmetic circuits with top fanin k. We give the first deterministic polynomial time blackbox identity test for EIIE(k) circuits over the field Q of rational numbers, thus resolving a question posed by Klivans and Spielman (STOC 2001).

Bibliographic Details
Main Authors: Kayal, Neeraj, Saraf, Shubhangi
Other Authors: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers 2010
Subjects:
Arithmetic circuits
Derandomization
Sylvester–Gallai Theorem
Online Access:http://hdl.handle.net/1721.1/59436

Internet

http://hdl.handle.net/1721.1/59436

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