Blackbox polynomial identity testing for depth 3 circuits
We study EIIE(k) circuits, i.e., depth three arithmetic circuits with top fanin k. We give the first deterministic polynomial time blackbox identity test for EIIE(k) circuits over the field Q of rational numbers, thus resolving a question posed by Klivans and Spielman (STOC 2001).
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| Format: | Article |
| Language: | en_US |
| Published: |
Institute of Electrical and Electronics Engineers
2010
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| Online Access: | http://hdl.handle.net/1721.1/59436 |