Performance analysis of ultra-scaled InAs HEMTs
The scaling behavior of ultra-scaled InAs HEMTs is investigated using a 2-dimensional real-space effective mass ballistic quantum transport simulator. The simulation methodology is first benchmarked against experimental Id-Vgs data obtained from devices with gate lengths ranging from 30 to 50 nm, wh...
Main Authors: | del Alamo, Jesus A., Kim, Dae-Hyun, Kharche, Neerav, Luisier, Mathieu |
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Other Authors: | Massachusetts Institute of Technology. Microsystems Technology Laboratories |
Format: | Article |
Language: | en_US |
Published: |
Institute of Electrical and Electronics Engineers
2010
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Online Access: | http://hdl.handle.net/1721.1/59451 |
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