Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings

The contributions to the magnetic anisotropy of thin-film rings and lines of width 50 nm and above made from Ti(5 nm)/Co[subscript 0.66]Cr[subscript 0.22]Pt[subscript 0.12] (10 and 20 nm)/Ti (3 nm) with a perpendicular magnetocrystalline anisotropy are investigated, using magnetic force microscopy t...

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Bibliographic Details
Main Authors: Velazquez, D., Nam, C. H., Ross, Caroline A., Navas, David Otero
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Language:en_US
Published: American Physical Society 2011
Online Access:http://hdl.handle.net/1721.1/60928
https://orcid.org/0000-0003-2262-1249