Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings
The contributions to the magnetic anisotropy of thin-film rings and lines of width 50 nm and above made from Ti(5 nm)/Co[subscript 0.66]Cr[subscript 0.22]Pt[subscript 0.12] (10 and 20 nm)/Ti (3 nm) with a perpendicular magnetocrystalline anisotropy are investigated, using magnetic force microscopy t...
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| Format: | Article |
| Language: | en_US |
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American Physical Society
2011
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| Online Access: | http://hdl.handle.net/1721.1/60928 https://orcid.org/0000-0003-2262-1249 |
| _version_ | 1826197809855987712 |
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| author | Velazquez, D. Nam, C. H. Ross, Caroline A. Navas, David Otero |
| author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Velazquez, D. Nam, C. H. Ross, Caroline A. Navas, David Otero |
| author_sort | Velazquez, D. |
| collection | MIT |
| description | The contributions to the magnetic anisotropy of thin-film rings and lines of width 50 nm and above made from Ti(5 nm)/Co[subscript 0.66]Cr[subscript 0.22]Pt[subscript 0.12] (10 and 20 nm)/Ti (3 nm) with a perpendicular magnetocrystalline anisotropy are investigated, using magnetic force microscopy to image the ac-demagnetized state. Four regimes of behavior were observed in both lines and rings. Samples with the largest widths (>500 nm) showed an out-of-plane maze domain structure typical of unpatterned films with domain widths of ∼200 nm. As the linewidth decreased, a ”bamboo” domain structure forms in which the domain walls lie approximately perpendicular to the linewidth. Further linewidth decreases result in a reorientation to a net in-plane anisotropy perpendicular to the linewidth, and for the narrowest lines, <200-nm wide, the anisotropy reorients in plane parallel to the line. The evolution of anisotropy is modeled in terms of contributions from magnetocrystalline, shape, and first- and second-order magnetoelastic terms, and good agreement with experiment is obtained, considering both bulk and surface anisotropy contributions. |
| first_indexed | 2024-09-23T10:53:29Z |
| format | Article |
| id | mit-1721.1/60928 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T10:53:29Z |
| publishDate | 2011 |
| publisher | American Physical Society |
| record_format | dspace |
| spelling | mit-1721.1/609282022-09-27T15:46:56Z Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings Velazquez, D. Nam, C. H. Ross, Caroline A. Navas, David Otero Massachusetts Institute of Technology. Department of Materials Science and Engineering Ross, Caroline A. Navas, David Otero Nam, C. H. Ross, Caroline A. The contributions to the magnetic anisotropy of thin-film rings and lines of width 50 nm and above made from Ti(5 nm)/Co[subscript 0.66]Cr[subscript 0.22]Pt[subscript 0.12] (10 and 20 nm)/Ti (3 nm) with a perpendicular magnetocrystalline anisotropy are investigated, using magnetic force microscopy to image the ac-demagnetized state. Four regimes of behavior were observed in both lines and rings. Samples with the largest widths (>500 nm) showed an out-of-plane maze domain structure typical of unpatterned films with domain widths of ∼200 nm. As the linewidth decreased, a ”bamboo” domain structure forms in which the domain walls lie approximately perpendicular to the linewidth. Further linewidth decreases result in a reorientation to a net in-plane anisotropy perpendicular to the linewidth, and for the narrowest lines, <200-nm wide, the anisotropy reorients in plane parallel to the line. The evolution of anisotropy is modeled in terms of contributions from magnetocrystalline, shape, and first- and second-order magnetoelastic terms, and good agreement with experiment is obtained, considering both bulk and surface anisotropy contributions. MIT-Spain/La Cambra de Barcelona Seed Fund Nanoelectronics Research Initiative (INDEX program) National Science Foundation (U.S.) 2011-02-11T19:17:46Z 2011-02-11T19:17:46Z 2010-06 2010-04 Article http://purl.org/eprint/type/JournalArticle 1098-0121 1550-235X http://hdl.handle.net/1721.1/60928 Navas, D. et al. “Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings.” Physical Review B 81.22 (2010): 224439. © 2010 The American Physical Society. https://orcid.org/0000-0003-2262-1249 en_US http://dx.doi.org/10.1103/PhysRevB.81.224439 Physical Review B Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society APS |
| spellingShingle | Velazquez, D. Nam, C. H. Ross, Caroline A. Navas, David Otero Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings |
| title | Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings |
| title_full | Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings |
| title_fullStr | Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings |
| title_full_unstemmed | Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings |
| title_short | Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings |
| title_sort | shape and strain induced magnetization reorientation and magnetic anisotropy in thin film ti cocrpt ti lines and rings |
| url | http://hdl.handle.net/1721.1/60928 https://orcid.org/0000-0003-2262-1249 |
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