Broad-band soft X-ray polarimetry

Broad-band soft X-ray polarimetry

We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations wi...

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Bibliographic Details
Main Authors: Schulz, Norbert S., Murphy, Kendrah Dawn, Marshall, Herman, Heilmann, Ralf K
Other Authors: MIT Kavli Institute for Astrophysics and Space Research
Format: Article
Language:en_US
Published: SPIE 2011
Online Access:http://hdl.handle.net/1721.1/61637
https://orcid.org/0000-0002-4727-686X

Internet

http://hdl.handle.net/1721.1/61637
https://orcid.org/0000-0002-4727-686X

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