Hybridization process for back-illuminated silicon Geiger-mode avalanche photodiode arrays

We present a unique hybridization process that permits high-performance back-illuminated silicon Geiger-mode avalanche photodiodes (GM-APDs) to be bonded to custom CMOS readout integrated circuits (ROICs) - a hybridization approach that enables independent optimization of the GM-APD arrays and the R...

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Bibliographic Details
Main Authors: Schuette, Daniel R., Westhoff, Richard C., Loomis, Andrew H., Young, Douglas J., Ciampi, Joseph S., Aull, Brian F., Reich, Robert K.
Other Authors: Lincoln Laboratory
Format: Article
Language:en_US
Published: SPIE 2011
Online Access:http://hdl.handle.net/1721.1/61643
https://orcid.org/0000-0002-8392-5468
Description
Summary:We present a unique hybridization process that permits high-performance back-illuminated silicon Geiger-mode avalanche photodiodes (GM-APDs) to be bonded to custom CMOS readout integrated circuits (ROICs) - a hybridization approach that enables independent optimization of the GM-APD arrays and the ROICs. The process includes oxide bonding of silicon GM-APD arrays to a transparent support substrate followed by indium bump bonding of this layer to a signal-processing ROIC. This hybrid detector approach can be used to fabricate imagers with high-fill-factor pixels and enhanced quantum efficiency in the near infrared as well as large-pixel-count, small-pixel-pitch arrays with pixel-level signal processing. In addition, the oxide bonding is compatible with high-temperature processing steps that can be used to lower dark current and improve optical response in the ultraviolet.