Degradation study of AIGaN/GaN HEMT through electro-thermo-mechanical calculations and thermo-reflectance measurements

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2010.

Bibliographic Details
Main Author:	Gao, Feng, Ph. D. Massachusetts Institute of Technology
Other Authors:	Tomás Palacios.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2011
Subjects:	Materials Science and Engineering.
Online Access:	http://hdl.handle.net/1721.1/62683

Internet

http://hdl.handle.net/1721.1/62683